| | 1: | | Title: | | | | | Volume/Number: | 2001 | | | | Issuing Agency: | | | | | Description: | As part of a study to estimate corn and soybean yields using satellite remote sensing techniques, biomass measurements, ground-level spectral measurements, and weather and energy flux measurements were taken at three locations in McLean County, Illinois. The locations were near Colfax, Lexington, and Stanford, Illinois. Plant samples and leaf area measurements were taken during the weeks of 12-17 June, 26-30 June, 10-14 July, 31 July-4 August, and 14-18 August 2000 in McLean County, Illinois. Corn plants were separated into leaf, stem, husk, and ear components, and soybean plants into leaf, stem, and pod components. The wet weights of the different plant parts were determined. To determine the plant dry biomass, the plant parts were dried in an oven until there was no weight change over two consecutive days. Leaf area for both corn and soybean canopies was measured using a LiCor-2000 instrument. Corn leaf area was also determined by manual measurements of leaf length and width. The smallest corn and soybean plants were at the Lexington location. The largest corn plants were at Colfax, and the largest soybean plants were at Stanford. The smaller plants at Lexington were a result of sandier soils containing less organic matter than the soils at either Stanford or Colfax. Although final yield was not measured as part of this sampling protocol, the size of the plants would indicate that Lexington should have the smallest corn and soybean yields, while the highest corn yields should have occurred at Colfax, and the highest soybean yields at Stanford. | | | | Date Created: | 9 24 2004 | | | | Agency ID: | CR-2001-13 | | | | ISL ID: | 000000000845 Original UID: 999999994328 FIRST WORD: Remote | |
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